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David Mark Brantley
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Flower Mound, TX, US
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last 30 patents
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Patent Grant
Test wrapper including integrated scan chain for testing embedded h...
Patent number
7,607,057
Issue date
Oct 20, 2009
LSI Corporation
Mark Allen Boike
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Test wrapper including integrated scan chain for testing embedded h...
Publication number
20060156100
Publication date
Jul 13, 2006
Mark Allen Boike
G01 - MEASURING TESTING