San Jose, CA, US
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Patent Grant
Xilinx, Inc.
Yongjun Zheng
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
Yuezhen Fan
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Grant
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
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Patent Application
Xilinx, Inc.
David Mark
H03 - BASIC ELECTRONIC CIRCUITRY
