David Marx

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Pasadena, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for optically measuring a structure
- Patent number 5,880,838
- Issue date Mar 9, 1999
- California Institute of California
- David Marx
- G01 - MEASURING TESTING
Information Patent Grant
Optical memory with pit depth encoding
- Patent number 5,453,969
- Issue date Sep 26, 1995
- California Institute of Technology
- Demetri Psaltis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY