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David McConnell
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Oakland, CA, US
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last 30 patents
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Patent Grant
Testing system and method
Patent number
10,444,278
Issue date
Oct 15, 2019
Xcerra Corporation
Benjamin Brown
G01 - MEASURING TESTING
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Patent Grant
Testing system and method
Patent number
10,379,154
Issue date
Aug 13, 2019
Xcerra Corporation
Benjamin Brown
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TESTING SYSTEM AND METHOD
Publication number
20180080978
Publication date
Mar 22, 2018
XCERRA CORPORATION
Benjamin Brown
G01 - MEASURING TESTING
Information
Patent Application
TESTING SYSTEM AND METHOD
Publication number
20180080979
Publication date
Mar 22, 2018
XCERRA CORPORATION
Benjamin Brown
G01 - MEASURING TESTING