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David Moshe
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Taanach, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Monitoring and compensating for real time local circuit speed in an...
Patent number
7,893,776
Issue date
Feb 22, 2011
Marvell Israel (M.I.S.L) Ltd.
Reuven Ecker
G01 - MEASURING TESTING
Information
Patent Grant
Jitter producing circuitry and methods
Patent number
7,849,370
Issue date
Dec 7, 2010
Marvell Israel (M.I.S.L) Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring and compensating for real time local circuit speed in an...
Patent number
7,714,670
Issue date
May 11, 2010
Marvell Israel (M.I.S.L) Ltd.
Reuven Ecker
G01 - MEASURING TESTING
Information
Patent Grant
Digitally controlled oscillator and associated method
Patent number
7,667,948
Issue date
Feb 23, 2010
Marvell Israel (M.I.S.L) Ltd.
Gil Asa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Jitter producing circuitry and methods
Patent number
7,439,785
Issue date
Oct 21, 2008
Marvell Israel (M.I.S.L) Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Grant
Diagonal matrix delay
Patent number
7,405,983
Issue date
Jul 29, 2008
Marvell Israel (M.I.S.L) Ltd.
Tomer Labin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Monitoring and compensating for real time local circuit speed in an...
Patent number
7,348,857
Issue date
Mar 25, 2008
Marvell Semiconductor Israel Ltd.
Reuven Ecker
G01 - MEASURING TESTING
Information
Patent Grant
Qualified data strobe signal for double data rate memory controller...
Patent number
7,345,933
Issue date
Mar 18, 2008
Marvell Semiconductor Israel Ltd.
Haggai Telem
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Digitally controlled oscillator and associated method
Patent number
7,330,081
Issue date
Feb 12, 2008
Marvell Semiconductor Israel Ltd.
Gil Asa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High-gain synchronizer circuitry and methods
Patent number
7,138,850
Issue date
Nov 21, 2006
Marvell Semiconductor Israel Ltd
Gil Asa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Jitter producing circuitry and methods
Patent number
7,135,904
Issue date
Nov 14, 2006
Marvell Semiconductor Israel Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Grant
Diagonal matrix delay
Patent number
7,050,341
Issue date
May 23, 2006
Marvell Semiconductor Israel Ltd.
Tomer Labin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase detector
Patent number
7,046,042
Issue date
May 16, 2006
Marvell Semiconductor Israel Ltd.
Shmuel Dino
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for a clock circuit
Patent number
6,580,301
Issue date
Jun 17, 2003
Motorola, Inc.
David Moshe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low jitter phase locked loop having a sigma delta modulator and a m...
Patent number
6,208,211
Issue date
Mar 27, 2001
Motorola Inc.
Eliav Zipper
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Jitter producing circuitry and methods
Publication number
20070036209
Publication date
Feb 15, 2007
Marvell Semiconductor Israel Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Application
Jitter producing circuitry and methods
Publication number
20070024336
Publication date
Feb 1, 2007
Marvell Semiconductor Israel Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Application
Jitter producing circuitry and methods
Publication number
20060255848
Publication date
Nov 16, 2006
Marvell Semiconductor Israel Ltd.
David Moshe
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for a clock circuit
Publication number
20020190772
Publication date
Dec 19, 2002
David Moshe
G06 - COMPUTING CALCULATING COUNTING