David MUTHERS

Person

Denzlingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Hall sensor and method for operation of such a sensor
- Patent number 11,397,223
- Issue date Jul 26, 2022
- TDK-Micronas GmbH
- Marc Baumann
- G01 - MEASURING TESTING
Information Patent Grant
Device and a method for processing a measurement signal from a magn...
- Patent number 10,907,989
- Issue date Feb 2, 2021
- TDK-MICRONAS GMBH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor
- Patent number 10,845,431
- Issue date Nov 24, 2020
- TDK-Micronas GmbH
- Marc Baumann
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a magnetic field detector circuit and a magnet...
- Patent number 10,018,685
- Issue date Jul 10, 2018
- TDK-MICRONAS GMBH
- Thomas Kauter
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for contactless measurement of an angle
- Patent number 9,933,279
- Issue date Apr 3, 2018
- TDK-MICRONAS GMBH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a signal path
- Patent number 9,739,845
- Issue date Aug 22, 2017
- TDK-MICRONAS GMBH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Grant
Continuous-time delta sigma modulator
- Patent number 9,024,795
- Issue date May 5, 2015
- Micronas GmbH
- David Muthers
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sensor module and method for monitoring the function thereof
- Patent number 8,878,529
- Issue date Nov 4, 2014
- Micronas GmbH
- Dieter Baecher
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring an angle at which a magnetic field...
- Patent number 8,125,221
- Issue date Feb 28, 2012
- Micronas GmbH
- David Muthers
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Chip With an Integrated Circuit
- Publication number 20240259006
- Publication date Aug 1, 2024
- TDK-Micronas GmbH
- David Muthers
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COMPENSATING A HARMONIC
- Publication number 20240118354
- Publication date Apr 11, 2024
- TDK - Micronas GmbH
- Jörg Franke
- G01 - MEASURING TESTING
Information Patent Application
Chopped Hall Sensor and Method for Measuring at Least One Hall Voltage
- Publication number 20230400536
- Publication date Dec 14, 2023
- TDK-Micrones GmbH
- Roberto Rivoir
- G01 - MEASURING TESTING
Information Patent Application
Hall Sensor and Method for Operation of Such a Sensor
- Publication number 20200025842
- Publication date Jan 23, 2020
- TDK-Micronas GmbH
- Marc Baumann
- G01 - MEASURING TESTING
Information Patent Application
Hall Sensor
- Publication number 20200025836
- Publication date Jan 23, 2020
- TDK-Micronas GmbH
- Marc Baumann
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND A METHOD FOR PROCESSING A MEASUREMENT SIGNAL FROM A MAGN...
- Publication number 20190162557
- Publication date May 30, 2019
- TDK - Micronas GmbH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING A MAGNETIC FIELD DETECTOR CIRCUIT AND A MAGNET...
- Publication number 20170153297
- Publication date Jun 1, 2017
- Micronas GmbH
- Thomas KAUTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A SIGNAL PATH
- Publication number 20160097806
- Publication date Apr 7, 2016
- Micronas GmbH
- David MUTHERS
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Contactless Measurement Of An Angle
- Publication number 20160011010
- Publication date Jan 14, 2016
- Micronas GmbH
- David Muthers
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS-TIME DELTA SIGMA MODULATOR
- Publication number 20140320325
- Publication date Oct 30, 2014
- Micronas GmbH
- David MUTHERS
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSOR MODULE AND METHOD FOR MONITORING THE FUNCTION THEREOF
- Publication number 20110234813
- Publication date Sep 29, 2011
- Dieter Baecher
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Measuring an Angle at which a Magnetic Field...
- Publication number 20100026287
- Publication date Feb 4, 2010
- Micronas GmbH
- David Muthers
- G01 - MEASURING TESTING

David MUTHERS

Person

Patents Grantslast 30 patents

Hall sensor and method for operation of such a sensor

Device and a method for processing a measurement signal from a magn...

Hall sensor

Method for operating a magnetic field detector circuit and a magnet...

Apparatus and method for contactless measurement of an angle

Method for testing a signal path

Continuous-time delta sigma modulator

Sensor module and method for monitoring the function thereof

Method and device for measuring an angle at which a magnetic field...

Patents Applicationslast 30 patents

Semiconductor Chip With an Integrated Circuit

COMPENSATING A HARMONIC

Chopped Hall Sensor and Method for Measuring at Least One Hall Voltage

Hall Sensor and Method for Operation of Such a Sensor

Hall Sensor

DEVICE AND A METHOD FOR PROCESSING A MEASUREMENT SIGNAL FROM A MAGN...

METHOD FOR OPERATING A MAGNETIC FIELD DETECTOR CIRCUIT AND A MAGNET...

METHOD FOR TESTING A SIGNAL PATH

Apparatus And Method For Contactless Measurement Of An Angle

CONTINUOUS-TIME DELTA SIGMA MODULATOR

SENSOR MODULE AND METHOD FOR MONITORING THE FUNCTION THEREOF

Method and Device for Measuring an Angle at which a Magnetic Field...