David Olson

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Gloucester, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining ion beam parallelism using refraction method
- Patent number 7,397,049
- Issue date Jul 8, 2008
- Varian Semiconductor Equipment Associates, Inc.
- Raymond Callahan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Determining ion beam parallelism using refraction method
- Publication number 20070221871
- Publication date Sep 27, 2007
- Varian Semiconductor Equipment Associates, Inc.
- Raymond Callahan
- H01 - BASIC ELECTRIC ELEMENTS