David Owen

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 11,829,077
- Issue date Nov 28, 2023
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING
- Publication number 20250216188
- Publication date Jul 3, 2025
- KLA Corporation
- Wenjiang Guo
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...
- Publication number 20250116598
- Publication date Apr 10, 2025
- KLA Corporation
- Daniel Ivanov Kavaldjiev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
- Publication number 20240094642
- Publication date Mar 21, 2024
- KLA Corporation
- Franz Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING POST BONDING OVERLAY
- Publication number 20220187718
- Publication date Jun 16, 2022
- KLA Corporation
- Franz Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY