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David P. Vallett
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Fairfax, VT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Mapping density and temperature of a chip, in situ
Patent number
9,140,669
Issue date
Sep 22, 2015
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Grant
Mapping density and temperature of a chip, in situ
Patent number
8,987,843
Issue date
Mar 24, 2015
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale fault isolation and measurement system
Patent number
7,671,604
Issue date
Mar 2, 2010
International Business Machines Corporation
Philip V. Kaszuba
G01 - MEASURING TESTING
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,620,931
Issue date
Nov 17, 2009
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanoscale fault isolation and measurement system
Patent number
7,511,510
Issue date
Mar 31, 2009
International Business Machines Corporation
Philip V. Kaszuba
G01 - MEASURING TESTING
Information
Patent Grant
Integrated carbon nanotube sensors
Patent number
7,484,423
Issue date
Feb 3, 2009
International Business Machines Corporation
Mark C. Hakey
G01 - MEASURING TESTING
Information
Patent Grant
Sensor differentiated fault isolation
Patent number
7,397,263
Issue date
Jul 8, 2008
International Business Machines Corporation
Kevin L. Condon
G01 - MEASURING TESTING
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,323,278
Issue date
Jan 29, 2008
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and structure for defect monitoring of semiconductor devices...
Patent number
7,285,860
Issue date
Oct 23, 2007
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Integrated carbon nanotube sensors
Patent number
7,247,877
Issue date
Jul 24, 2007
International Business Machines Corporation
Mark C. Hakey
G01 - MEASURING TESTING
Information
Patent Grant
Method of adding fabrication monitors to integrated circuit chips
Patent number
7,240,322
Issue date
Jul 3, 2007
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Utilizing clock shield as defect monitor
Patent number
7,239,167
Issue date
Jul 3, 2007
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Inspection methods and structures for visualizing and/or detecting...
Patent number
7,230,335
Issue date
Jun 12, 2007
International Business Machines Corporation
Jerome L. Cann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor differentiated fault isolation
Patent number
7,202,689
Issue date
Apr 10, 2007
International Business Machines Corporation
Kevin L. Condon
G01 - MEASURING TESTING
Information
Patent Grant
Designing scan chains with specific parameter sensitivities to iden...
Patent number
7,194,706
Issue date
Mar 20, 2007
International Business Machines Corporation
James W. Adkisson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for transmission and remote sensing of signals...
Patent number
7,116,094
Issue date
Oct 3, 2006
International Business Machines Corporation
Theodore M. Levin
G01 - MEASURING TESTING
Information
Patent Grant
Canary device for failure analysis
Patent number
7,089,138
Issue date
Aug 8, 2006
International Business Machines Corporation
Pierre J. Bouchard
G01 - MEASURING TESTING
Information
Patent Grant
Utilizing clock shield as defect monitor
Patent number
7,088,124
Issue date
Aug 8, 2006
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Method and structure for defect monitoring of semiconductor devices...
Patent number
7,078,248
Issue date
Jul 18, 2006
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Utilizing clock shield as defect monitor
Patent number
7,005,874
Issue date
Feb 28, 2006
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
Patent number
6,650,768
Issue date
Nov 18, 2003
International Business Machines Corporation
Richard James Evans
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices having backside probing capability
Patent number
6,452,209
Issue date
Sep 17, 2002
International Business Machines Corporation
David P. Vallett
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit wiring
Patent number
6,307,162
Issue date
Oct 23, 2001
International Business Machines Corporation
Mark E. Masters
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Using time resolved light emission from VLSI circuit devices for na...
Patent number
6,304,668
Issue date
Oct 16, 2001
International Business Machines Corporation
Richard James Evans
Information
Patent Grant
Method for making semiconductor devices having backside probing cap...
Patent number
6,245,587
Issue date
Jun 12, 2001
International Business Machines Corporation
David P. Vallett
G01 - MEASURING TESTING
Information
Patent Grant
Micro probe ring assembly and method of fabrication
Patent number
6,232,143
Issue date
May 15, 2001
International Business Machines Corporation
John Thomas Maddix
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices having backside probing capability
Patent number
6,078,057
Issue date
Jun 20, 2000
International Business Machines Corporation
David P. Vallett
G01 - MEASURING TESTING
Information
Patent Grant
Micro probe ring assembly and method of fabrication
Patent number
6,014,032
Issue date
Jan 11, 2000
International Business Machines Corporation
John Thomas Maddix
G01 - MEASURING TESTING
Information
Patent Grant
Die thinning apparatus
Patent number
6,010,392
Issue date
Jan 4, 2000
International Business Machines Corporation
Richard J. Evans
B24 - GRINDING POLISHING
Information
Patent Grant
Semiconductor devices having backside probing capability
Patent number
5,990,562
Issue date
Nov 23, 1999
International Business Machines Corporation
David P. Vallett
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAPPING DENSITY AND TEMPERATURE OF A CHIP, IN SITU
Publication number
20150021605
Publication date
Jan 22, 2015
International Business Machines Corporation
Jerome L. CANN
G01 - MEASURING TESTING
Information
Patent Application
MAPPING DENSITY AND TEMPERATURE OF A CHIP, IN SITU
Publication number
20140124878
Publication date
May 8, 2014
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM
Publication number
20080238457
Publication date
Oct 2, 2008
International Business Machines Corporation
Philip V. Kaszuba
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20080017857
Publication date
Jan 24, 2008
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOSCALE FAULT ISOLATION AND MEASUREMENT SYSTEM
Publication number
20070222456
Publication date
Sep 27, 2007
International Business Machines Corporation
Philip V. Kaszuba
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
Publication number
20070197010
Publication date
Aug 23, 2007
Mark C. Hakey
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20070160920
Publication date
Jul 12, 2007
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
Publication number
20070126450
Publication date
Jun 7, 2007
Kevin L. Condon
G01 - MEASURING TESTING
Information
Patent Application
UTILIZING CLOCK SHIELD AS DEFECT MONITOR
Publication number
20070108964
Publication date
May 17, 2007
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DIFFERENTIATED FAULT ISOLATION
Publication number
20060232284
Publication date
Oct 19, 2006
International Business Machines Corporation
Kevin L. Condon
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
Publication number
20060225023
Publication date
Oct 5, 2006
International Business Machines Corporation
James W. Adkisson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CANARY DEVICE FOR FAILURE ANALYSIS
Publication number
20060195285
Publication date
Aug 31, 2006
International Business Machines Corporation
Pierre J. Bouchard
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...
Publication number
20060170104
Publication date
Aug 3, 2006
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION METHODS AND STRUCTURES FOR VISUALIZING AND/OR DETECTING...
Publication number
20060071208
Publication date
Apr 6, 2006
International Business Machines Corporation
Jerome L. Cann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Utilizing clock shield as defect monitor
Publication number
20060066342
Publication date
Mar 30, 2006
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
Publication number
20060038167
Publication date
Feb 23, 2006
International Business Machines Corporation
Mark C. Hakey
G01 - MEASURING TESTING
Information
Patent Application
Designing Scan Chains With Specific Parameter Sensitivities to Iden...
Publication number
20060026472
Publication date
Feb 2, 2006
International Business Machines Corporation
James W. Adkisson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AN APPARATUS AND METHOD FOR TRANSMISSION AND REMOTE SENSING OF SIGN...
Publication number
20060022671
Publication date
Feb 2, 2006
International Business Machines Corporation
Theodore M. Levin
G01 - MEASURING TESTING
Information
Patent Application
UTILIZING CLOCK SHIELD AS DEFECT MONITOR
Publication number
20050285611
Publication date
Dec 29, 2005
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND STRUCTURE FOR DEFECT MONITORING OF SEMICONDUCTOR DEVICES...
Publication number
20050282297
Publication date
Dec 22, 2005
International Business Machines Corporation
John M. Cohn
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor devices having backside probing capability
Publication number
20010006233
Publication date
Jul 5, 2001
David P. Vallett
G01 - MEASURING TESTING