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David Patrick Fromm
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Palo Alto, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Probe tip assembly for scanning probe microscopes
Patent number
8,136,389
Issue date
Mar 20, 2012
Agilent Technologies, Inc.
Richard Paul Tella
B82 - NANO-TECHNOLOGY
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Patent Grant
System for scanning probe microscope input device
Patent number
7,659,509
Issue date
Feb 9, 2010
Agilent Technologies, Inc.
Richard K. Workman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Time-Tagged Data for Atomic Force Microscopy
Publication number
20090139313
Publication date
Jun 4, 2009
David Patrick Fromm
G01 - MEASURING TESTING
Information
Patent Application
PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES
Publication number
20090107266
Publication date
Apr 30, 2009
Richard Paul Tella
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPE INPUT DEVICE
Publication number
20080142708
Publication date
Jun 19, 2008
Richard K. Workman
G01 - MEASURING TESTING