David Pullen

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for passive phase change thermal management
- Patent number 7,886,809
- Issue date Feb 15, 2011
- Intel Corporation
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Integrated circuit burn-in methods and apparatus
- Patent number 7,449,904
- Issue date Nov 11, 2008
- Intel Corporation
- David H. Pullen
- G01 - MEASURING TESTING
Information Patent Grant
Method for passive phase change thermal management
- Patent number 7,316,265
- Issue date Jan 8, 2008
- Intel Corporation
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Integrated circuit burn-in systems
- Patent number 6,980,016
- Issue date Dec 27, 2005
- Intel Corporation
- David H. Pullen
- G01 - MEASURING TESTING
Information Patent Grant
Electronic assembly having an indium thermal couple
- Patent number 6,882,043
- Issue date Apr 19, 2005
- Intel Corporation
- Terrance J. Dishongh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for passive phase change thermal management
- Patent number 6,672,370
- Issue date Jan 6, 2004
- Intel Corporation
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Method of constructing an electronic assembly having an indium ther...
- Patent number 6,461,891
- Issue date Oct 8, 2002
- Intel Corporation
- Terrance J. Dishongh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for early detection of reliability degradation...
- Patent number 6,452,502
- Issue date Sep 17, 2002
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection of electrical overstress
- Patent number 6,441,675
- Issue date Aug 27, 2002
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection of electrical overstress
- Patent number 6,433,616
- Issue date Aug 13, 2002
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for early detection of reliability degradation...
- Patent number 6,366,209
- Issue date Apr 2, 2002
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detection of electrical overstress
- Patent number 6,255,893
- Issue date Jul 3, 2001
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for early detection of reliability degradation...
- Patent number 6,094,144
- Issue date Jul 25, 2000
- Intel Corporation
- Terrance J. Dishongh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR PASSIVE PHASE CHANGE THERMAL MANAGEMENT
- Publication number 20080066890
- Publication date Mar 20, 2008
- Intel Corporation
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
Integrated circuit burn-in methods and apparatus
- Publication number 20050240844
- Publication date Oct 27, 2005
- Intel Corporation
- David H. Pullen
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for passive phase change thermal management
- Publication number 20050051300
- Publication date Mar 10, 2005
- Intel Corporation
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
Integrated circuit burn-in methods and apparatus
- Publication number 20030001604
- Publication date Jan 2, 2003
- Intel Corporation
- David H. Pullen
- G01 - MEASURING TESTING
Information Patent Application
Method of constructing an electronic assembly having an indium ther...
- Publication number 20020151110
- Publication date Oct 17, 2002
- Intel Corporation
- Terrance J. Dishongh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for passive phase change thermal management
- Publication number 20020104641
- Publication date Aug 8, 2002
- Damion T. Searls
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
METHOD OF CONSTRUCTING AN ELECTRONIC ASSEMBLY HAVING AN INDIUM THER...
- Publication number 20020020912
- Publication date Feb 21, 2002
- TERRANCE J. DISHONGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for early detection of reliability degradation...
- Publication number 20010043143
- Publication date Nov 22, 2001
- Terrance J. Dishongh
- G01 - MEASURING TESTING

David Pullen

Person

Patents Grantslast 30 patents

Apparatus and method for passive phase change thermal management

Integrated circuit burn-in methods and apparatus

Method for passive phase change thermal management

Integrated circuit burn-in systems

Electronic assembly having an indium thermal couple

Apparatus and method for passive phase change thermal management

Method of constructing an electronic assembly having an indium ther...

Method and apparatus for early detection of reliability degradation...

Method and apparatus for detection of electrical overstress

Method and apparatus for detection of electrical overstress

Method and apparatus for early detection of reliability degradation...

Method and apparatus for detection of electrical overstress

Method and apparatus for early detection of reliability degradation...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR PASSIVE PHASE CHANGE THERMAL MANAGEMENT

Integrated circuit burn-in methods and apparatus

Apparatus and method for passive phase change thermal management

Integrated circuit burn-in methods and apparatus

Method of constructing an electronic assembly having an indium ther...

Apparatus and method for passive phase change thermal management

METHOD OF CONSTRUCTING AN ELECTRONIC ASSEMBLY HAVING AN INDIUM THER...

Method and apparatus for early detection of reliability degradation...