David R. Bakker

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for measuring a characteristic of a substrate o...
- Patent number 8,765,496
- Issue date Jul 1, 2014
- KLA-Tencor Technologies Corp.
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for acquiring information about a defect on a s...
- Patent number 8,045,145
- Issue date Oct 25, 2011
- KLA-Tencor Technologies Corp.
- Dave Bakker
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for searching through and analyzing defect im...
- Patent number 7,283,659
- Issue date Oct 16, 2007
- KLA-Tencor Technologies Corporation
- David R. Bakker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power assisted automatic supervised classifier creation tool for se...
- Patent number 6,999,614
- Issue date Feb 14, 2006
- KLA-Tencor Corporation
- David Bakker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single tool defect classification solution
- Patent number 6,952,653
- Issue date Oct 4, 2005
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Motion picture output from electron microscope
- Patent number 6,770,879
- Issue date Aug 3, 2004
- KLA-Tencor Technologies Corporation
- Amir Azordegan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Measuring a Characteristic of a Substrate o...
- Publication number 20140291516
- Publication date Oct 2, 2014
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING A CHARACTERISTIC OF A SUBSTRATE O...
- Publication number 20080264905
- Publication date Oct 30, 2008
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for measuring a characteristic of a substrate o...
- Publication number 20050221229
- Publication date Oct 6, 2005
- Mehran Nasser-Ghodsi
- G01 - MEASURING TESTING
Information Patent Application
Single tool defect classification solution
- Publication number 20050033528
- Publication date Feb 10, 2005
- KLA-Tencor Technologies, Corporation
- Gabor D. Toth
- G06 - COMPUTING CALCULATING COUNTING