David R. Goulet

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Milton, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of reconstructing electrical probes
- Patent number 9,435,828
- Issue date Sep 6, 2016
- GLOBALFOUNDRIES Inc.
- David R. Goulet
- G01 - MEASURING TESTING
Information Patent Grant
Methods of forming structures with a focused ion beam for use in at...
- Patent number 8,749,057
- Issue date Jun 10, 2014
- International Business Machines Corporation
- David R. Goulet
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of forming structures with a focused ion beam for use in at...
- Patent number 8,377,722
- Issue date Feb 19, 2013
- International Business Machines Corporation
- David Raymond Goulet
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method of Reconstructing Electrical Probes
- Publication number 20140347038
- Publication date Nov 27, 2014
- International Business Machines Corporation
- David R. Goulet
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FORMING STRUCTURES WITH A FOCUSED ION BEAM FOR USE IN AT...
- Publication number 20130048983
- Publication date Feb 28, 2013
- International Business Machines Corporation
- David R. Goulet
- B82 - NANO-TECHNOLOGY
Information Patent Application
Methods of Forming Structures with a Focused ION Beam for Use in At...
- Publication number 20110193085
- Publication date Aug 11, 2011
- International Business Machines Corporation
- David R. Goulet
- G01 - MEASURING TESTING