David R. Miers

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Vernon, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting scattered light in an analytical...
- Patent number 5,872,627
- Issue date Feb 16, 1999
- Bayer Corporation
- David R. Miers
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for filtering a laser beam in an analytical instrument
- Patent number 5,719,667
- Issue date Feb 17, 1998
- Bayer Corporation
- David R. Miers
- G01 - MEASURING TESTING