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David R. Turner
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Albuquerque, NM, US
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern component analysis and manipulation
Patent number
7,137,098
Issue date
Nov 14, 2006
LSI Logic Corporation
Bruce J. Whitefield
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Parametric outlier detection
Patent number
7,062,415
Issue date
Jun 13, 2006
LSI Logic Corporation
Bruce J. Whitefield
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Pattern component analysis and manipulation
Publication number
20060059452
Publication date
Mar 16, 2006
Bruce J. Whitefield
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Parametric outlier detection
Publication number
20060047485
Publication date
Mar 2, 2006
Bruce J. Whitefield
G06 - COMPUTING CALCULATING COUNTING