David R. Veteran

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Santa Rosa, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Compliant wafer prober docking adapter
- Patent number 5,923,180
- Issue date Jul 13, 1999
- Hewlett-Packard Company
- Julius K. Botka
- G01 - MEASURING TESTING
Information Patent Grant
Blind mate connector for an electronic circuit tester
- Patent number 5,558,541
- Issue date Sep 24, 1996
- Hewlett-Packard Company
- Julius K. Botka
- G01 - MEASURING TESTING
Information Patent Grant
Docking system for an electronic circuit tester
- Patent number 5,552,701
- Issue date Sep 3, 1996
- Hewlett-Packard Company
- David R. Veteran
- G01 - MEASURING TESTING