David Reich

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Carver, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
All surface data for use in substrate inspection
- Patent number 7,835,566
- Issue date Nov 16, 2010
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING
Information Patent Grant
All surface data for use in substrate inspection
- Patent number 7,593,565
- Issue date Sep 22, 2009
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ALL SURFACE DATA FOR USE IN SUBSTRATE INSPECTION
- Publication number 20100067779
- Publication date Mar 18, 2010
- Rudolph Technologies, Inc.
- David Reich
- G01 - MEASURING TESTING
Information Patent Application
All surface data for use in substrate inspection
- Publication number 20060142971
- Publication date Jun 29, 2006
- David Reich
- G01 - MEASURING TESTING