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David Ridyard
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Novato, CA, US
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last 30 patents
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Patent Grant
Method of determining subsurface properties using multifrequency el...
Patent number
10,830,915
Issue date
Nov 10, 2020
EM Locator Technology, LLC
Franz Van de Kop
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
CONTINUOUS SEISMIC DATA ACQUISITION HAVING VARIABLE DENSITY SOURCE...
Publication number
20230184978
Publication date
Jun 15, 2023
ACTeQ LLC
David Ridyard
G01 - MEASURING TESTING
Information
Patent Application
CONTINUOUS SEISMIC DATA ACQUISITION HAVING VARIABLE DENSITY SOURCE...
Publication number
20230184979
Publication date
Jun 15, 2023
ACTeQ LLC
David Ridyard
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETERMINING SUBSURFACE PROPERTIES USING MULTIFREQUENCY EL...
Publication number
20190235102
Publication date
Aug 1, 2019
EM Locator Technology, LLC
Franz Van de Kop
G01 - MEASURING TESTING