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David S. DENU
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Yorktown Heights, NY, US
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last 30 patents
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Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
Patent number
9,004,838
Issue date
Apr 14, 2015
Microtronic, Inc.
Reiner G. Fenske
G01 - MEASURING TESTING
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Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
Patent number
8,851,816
Issue date
Oct 7, 2014
Microtronic, Inc.
Reiner G. Fenske
G01 - MEASURING TESTING
Information
Patent Grant
Versatile robotic module and robots comprising same
Patent number
8,196,492
Issue date
Jun 12, 2012
David Sutton Denu
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
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Patent Grant
Automated slide loader cassette for microscope
Patent number
6,847,481
Issue date
Jan 25, 2005
Ludl Electronics Products, Ltd.
Helmut Ludl
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS, SYSTEM, AND METHODS FOR WEIGHING AND POSITIONING WAFERS
Publication number
20150219486
Publication date
Aug 6, 2015
MICROTRONIC, INC.
Reiner G. FENSKE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
Publication number
20120255795
Publication date
Oct 11, 2012
MICROTRONIC, INC.
Reiner G. FENSKE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
Publication number
20120255794
Publication date
Oct 11, 2012
MICROTRONIC, INC.
Reiner G. FENSKE
G01 - MEASURING TESTING