David S. Perloff

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Los Altos Hills, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for depth profiling and characterization of thin...
- Patent number 7,449,682
- Issue date Nov 11, 2008
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for depth profiling and characterization of thin...
- Publication number 20040238735
- Publication date Dec 2, 2004
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
System and method for characterization of thin films
- Publication number 20030080291
- Publication date May 1, 2003
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING