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David SCHIENER
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Ganei Yehuda, IL
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Patents Grants
last 30 patents
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Patent Grant
Lateral shift measurement using an optical technique
Patent number
9,310,192
Issue date
Apr 12, 2016
Nova Measuring Instruments, Ltd.
Boaz Brill
G01 - MEASURING TESTING
Information
Patent Grant
Lateral shift measurement using an optical technique
Patent number
8,941,832
Issue date
Jan 27, 2015
Nova Measuring Instruments, Ltd.
Boaz Brill
G01 - MEASURING TESTING
Information
Patent Grant
Lateral shift measurement using an optical technique
Patent number
8,363,219
Issue date
Jan 29, 2013
Nova Measuring Instruments Ltd.
Boaz Brill
G01 - MEASURING TESTING
Information
Patent Grant
Lateral shift measurement using an optical technique
Patent number
7,715,007
Issue date
May 11, 2010
Nova Measuring Instruments, Ltd.
Boaz Brill
G01 - MEASURING TESTING
Information
Patent Grant
Lateral shift measurement using an optical technique
Patent number
7,301,163
Issue date
Nov 27, 2007
Nova Measuring Instruments Ltd.
Boaz Brill
G01 - MEASURING TESTING
Information
Patent Grant
Lateral shift measurement using an optical technique
Patent number
7,122,817
Issue date
Oct 17, 2006
Nova Measuring Instruments Ltd.
Boaz Brill
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
Publication number
20160327384
Publication date
Nov 10, 2016
NOVA MEASURING INSTRUMENTS LTD.
Boaz BRILL
G01 - MEASURING TESTING
Information
Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
Publication number
20150124255
Publication date
May 7, 2015
NOVA MEASURING INSTRUMENTS LTD.
Boaz BRILL
G01 - MEASURING TESTING
Information
Patent Application
LATERAL SHIFT MEASUREMENT USING AN OPTICAL TECHNIQUE
Publication number
20130128270
Publication date
May 23, 2013
NOVA MEASURING INSTRUMENTS LTD.
Boaz BRILL
G01 - MEASURING TESTING