David Scott

Follow

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel processing pattern generation system for an integrated cir...
- Patent number 6,073,263
- Issue date Jun 6, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester having pattern generator controlled data bus
- Patent number 5,951,705
- Issue date Sep 14, 1999
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING