David Sliwinski

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Vestal, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
System to control insertion of care-bits in an IC test vector impro...
- Patent number 8,120,378
- Issue date Feb 21, 2012
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Grant
Method and article of manufacture to generate IC test vector for sy...
- Patent number 7,821,276
- Issue date Oct 26, 2010
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Grant
Isolating the location of defects in scan chains
- Patent number 7,496,816
- Issue date Feb 24, 2009
- Cadence Design System, Inc.
- Thomas W. Bartenstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING
- Publication number 20100321055
- Publication date Dec 23, 2010
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Application
IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING
- Publication number 20080284453
- Publication date Nov 20, 2008
- Cadence Design Systems, Inc.
- Joseph Swenton
- G01 - MEASURING TESTING
Information Patent Application
Isolating the location of defects in scan chains
- Publication number 20070220384
- Publication date Sep 20, 2007
- Quickturn Design Systems, Inc.
- Thomas W. Bartenstein
- G01 - MEASURING TESTING