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David Su
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Hsinchu City, TW
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last 30 patents
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Patent Grant
Apparatus and method for metrology
Patent number
11,525,668
Issue date
Dec 13, 2022
Taiwan Semiconductor Manufacturing Co., Ltd
Ji-Feng Ying
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for metrology
Patent number
10,883,820
Issue date
Jan 5, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Baohua Niu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection method for wafer or DUT
Patent number
10,679,820
Issue date
Jun 9, 2020
Taiwan Semiconductor Manufacturing Co., Ltd
Bao-Hua Niu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer and DUT inspection apparatus and method using thereof
Patent number
10,141,158
Issue date
Nov 27, 2018
Taiwan Semiconductor Manufacturing Co., Ltd
Bao-Hua Niu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD FOR METROLOGY
Publication number
20210148695
Publication date
May 20, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Ji-Feng YING
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR METROLOGY
Publication number
20190145756
Publication date
May 16, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Baohua NIU
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
INSPECTION METHOD FOR WAFER OR DUT
Publication number
20190103248
Publication date
Apr 4, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Bao-Hua Niu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER AND DUT INSPECTION APPARATUS AND METHOD USING THEREOF
Publication number
20180158647
Publication date
Jun 7, 2018
Taiwan Semiconductor Manufacturing Co., Ltd.
Bao-Hua Niu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for building a vapa by using wireless-LAN interface card
Publication number
20030172142
Publication date
Sep 11, 2003
David Su
H04 - ELECTRIC COMMUNICATION TECHNIQUE