David T. Crook

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adjustment of measurement system components
- Patent number 10,006,863
- Issue date Jun 26, 2018
- Hach Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Adjustment of measurement system components
- Patent number 9,329,054
- Issue date May 3, 2016
- Hach Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Probe based information storage for probes used for opens detection...
- Patent number 7,492,170
- Issue date Feb 17, 2009
- Agilent Technologies, Inc.
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Probe based information storage for probes used for opens detection...
- Patent number 7,109,728
- Issue date Sep 19, 2006
- Agilent Technologies, Inc.
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive probe assembly with flex circuit
- Patent number 6,930,494
- Issue date Aug 16, 2005
- Agilent Technologies, Inc.
- Curtis A. Tesdahl
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for supplying power, and channeling analog mea...
- Patent number 6,901,336
- Issue date May 31, 2005
- Agilent Technologies, Inc.
- Curtis Alan Tesdahl
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for configurable hardware augmented program ge...
- Patent number 6,876,214
- Issue date Apr 5, 2005
- Agilent Technologies, Inc.
- David T Crook
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for configurable hardware augmented program ge...
- Patent number 6,636,061
- Issue date Oct 21, 2003
- Agilent Technologies, Inc.
- David T Crook
- G01 - MEASURING TESTING
Information Patent Grant
Multiple axis magnetic test for open integrated circuit pins
- Patent number 6,529,019
- Issue date Mar 4, 2003
- Agilent Technologies, Inc.
- Philip N King
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adaptively learning test measurement delay...
- Patent number 6,377,901
- Issue date Apr 23, 2002
- Agilent Technologies, Inc.
- Steven K List
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for adaptively learning test error sources to...
- Patent number 6,324,486
- Issue date Nov 27, 2001
- Agilent Technologies, Inc.
- David T. Crook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of pin-open faults by capacitive coupling
- Patent number 5,696,451
- Issue date Dec 9, 1997
- Hewlett-Packard Co.
- Kevin W. Keirn
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring the integrity of an electrical contact
- Patent number 5,625,292
- Issue date Apr 29, 1997
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Identification of pin-open faults by capacitive coupling through th...
- Patent number 5,557,209
- Issue date Sep 17, 1996
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive electrode system for detecting open solder joints in pri...
- Patent number 5,498,964
- Issue date Mar 12, 1996
- Hewlett-Packard Company
- Ronald K. Kerschner
- G01 - MEASURING TESTING
Information Patent Grant
Electrical assembly testing using robotic positioning of probes
- Patent number 5,469,064
- Issue date Nov 21, 1995
- Hewlett-Packard Company
- Ronald K. Kerschner
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Circuit testing system
- Patent number 5,381,417
- Issue date Jan 10, 1995
- Hewlett-Packard Company
- Alex Loopik
- G01 - MEASURING TESTING
Information Patent Grant
Capacitively-coupled test probe
- Patent number 5,274,336
- Issue date Dec 28, 1993
- Hewlett-Packard Company
- David T. Crook
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Identification of pin-open faults by capacitive coupling through th...
- Patent number 5,254,953
- Issue date Oct 19, 1993
- Hewlett-Packard Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Grant
In-circuit transistor beta test and method
- Patent number 4,801,878
- Issue date Jan 31, 1989
- Hewlett-Packard Company
- Ronald J. Peiffer
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and apparatus which enable elimination of setup time and h...
- Patent number 4,799,023
- Issue date Jan 17, 1989
- Hewlett-Packard Company
- Kamran Firooz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADJUSTMENT OF MEASUREMENT SYSTEM COMPONENTS
- Publication number 20160202182
- Publication date Jul 14, 2016
- Hach Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT OF MEASUREMENT SYSTEM COMPONENTS
- Publication number 20130256515
- Publication date Oct 3, 2013
- Hach Company
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Application
Probe based information storage for probes used for opens detection...
- Publication number 20060279295
- Publication date Dec 14, 2006
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for supplying power, and channeling analog mea...
- Publication number 20040190464
- Publication date Sep 30, 2004
- Curtis Alan Tesdahl
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Probe based information storage for probes used for opens detection...
- Publication number 20040164752
- Publication date Aug 26, 2004
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for configurable hardware augmented program ge...
- Publication number 20040027148
- Publication date Feb 12, 2004
- David T. Crook
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ADAPTIVELY LEARNING TEST MEASUREMENT DELAY...
- Publication number 20020045997
- Publication date Apr 18, 2002
- STEVEN K. LIST
- G01 - MEASURING TESTING

David T. Crook

Person

Patents Grantslast 30 patents

Adjustment of measurement system components

Adjustment of measurement system components

Probe based information storage for probes used for opens detection...

Probe based information storage for probes used for opens detection...

Capacitive probe assembly with flex circuit

Method and apparatus for supplying power, and channeling analog mea...

Method and apparatus for configurable hardware augmented program ge...

Method and apparatus for configurable hardware augmented program ge...

Multiple axis magnetic test for open integrated circuit pins

Method and apparatus for adaptively learning test measurement delay...

Method and apparatus for adaptively learning test error sources to...

Identification of pin-open faults by capacitive coupling

System for measuring the integrity of an electrical contact

Identification of pin-open faults by capacitive coupling through th...

Capacitive electrode system for detecting open solder joints in pri...

Electrical assembly testing using robotic positioning of probes

Circuit testing system

Capacitively-coupled test probe

Identification of pin-open faults by capacitive coupling through th...

In-circuit transistor beta test and method

Circuits and apparatus which enable elimination of setup time and h...

Patents Applicationslast 30 patents

ADJUSTMENT OF MEASUREMENT SYSTEM COMPONENTS

ADJUSTMENT OF MEASUREMENT SYSTEM COMPONENTS

Probe based information storage for probes used for opens detection...

Method and apparatus for supplying power, and channeling analog mea...

Probe based information storage for probes used for opens detection...

Method and apparatus for configurable hardware augmented program ge...

METHOD AND APPARATUS FOR ADAPTIVELY LEARNING TEST MEASUREMENT DELAY...