David T. Lee

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Dublin, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring nm-scale tip-sample capacitance
- Patent number 7,023,220
- Issue date Apr 4, 2006
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING
Information Patent Grant
Direct, low frequency capacitance measurement for scanning capacita...
- Patent number 6,856,145
- Issue date Feb 15, 2005
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for measuring nm-scale tip-sample capacitance
- Publication number 20050077915
- Publication date Apr 14, 2005
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING
Information Patent Application
Direct, low frequency capacitance measurement for scanning capacita...
- Publication number 20040008042
- Publication date Jan 15, 2004
- The Ohio State University
- Jonathan P. Pelz
- G01 - MEASURING TESTING