David Tatman

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Missouri City, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Circuit and method for sensing depletion of memory cells
- Patent number 5,371,706
- Issue date Dec 6, 1994
- Texas Instruments Incorporated
- Steven V. Krentz
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit internal test mode indicator circuit
- Patent number 5,255,271
- Issue date Oct 19, 1993
- Texas Instruments Incorporated
- David Tatman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit fuse-link tester and test method
- Patent number 5,140,554
- Issue date Aug 18, 1992
- Texas Instruments Incorporated
- John F. Schreck
- G11 - INFORMATION STORAGE