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David Tio Castro
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Oud Heverlee, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
Patent number
10,197,520
Issue date
Feb 5, 2019
AMS International AG
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Grant
Gas sensor
Patent number
9,244,031
Issue date
Jan 26, 2016
NXP, B.V.
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device, and method of manufacturing an electronic device
Patent number
9,190,611
Issue date
Nov 17, 2015
NXP B.V.
David Tio Castro
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Integrated circuit and manufacturing method
Patent number
9,052,267
Issue date
Jun 9, 2015
NXP, B.V.
Youri Victorovitch Ponomarev
G01 - MEASURING TESTING
Information
Patent Grant
Light sensor with a photoresistive element having a comb structure
Patent number
8,912,478
Issue date
Dec 16, 2014
NXP, B.V.
David Tio Castro
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit and manufacturing method
Patent number
8,896,073
Issue date
Nov 25, 2014
NXP B.V.
Youri Victorovitch Ponomarev
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit
Patent number
8,847,339
Issue date
Sep 30, 2014
NXP B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device, and method of operating an electronic device
Patent number
8,379,438
Issue date
Feb 19, 2013
NXP B.V.
David Tio Castro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device comprising a convertible structure
Patent number
8,368,044
Issue date
Feb 5, 2013
NXP B.V.
David Tio Castro
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
Publication number
20150031158
Publication date
Jan 29, 2015
NXP B.V.
Youri Victorovitch Ponomarev
G01 - MEASURING TESTING
Information
Patent Application
Integrated Circuit and Manufacturing Method
Publication number
20130214274
Publication date
Aug 22, 2013
NXP B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Application
Integrated Circuit and Manufacturing Method
Publication number
20130193417
Publication date
Aug 1, 2013
NXP B.V.
Youri Victorovitch Ponomarev
G01 - MEASURING TESTING
Information
Patent Application
GAS SENSOR
Publication number
20130042669
Publication date
Feb 21, 2013
NXP B.V.
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
Publication number
20130032903
Publication date
Feb 7, 2013
NXP B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSOR
Publication number
20110303829
Publication date
Dec 15, 2011
NXP B.V.
David Tio Castro
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT COMPRISING A CONVERTIBLE STRUCTURE
Publication number
20110012082
Publication date
Jan 20, 2011
NXP B.V.
David Tio Castro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE COMPRISING A CONVERTIBLE STRUCTURE
Publication number
20100295010
Publication date
Nov 25, 2010
NXP, B.V.
David Tio Castro
G11 - INFORMATION STORAGE
Information
Patent Application
Electronic Device, And Method of Operating An Electronic Device
Publication number
20100238720
Publication date
Sep 23, 2010
NXP B.V.
David Tio Castro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC DEVICE, AND METHOD OF MANUFACTURING AN ELECTRONIC DEVICE
Publication number
20100176364
Publication date
Jul 15, 2010
NXP B.V.
David Tio Castro
G11 - INFORMATION STORAGE