David VandenBerg

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San Mateo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer temperature measurement tool
- Patent number 9,196,516
- Issue date Nov 24, 2015
- Qualitau, Inc.
- Edward McCloud
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER TEMPERATURE MEASUREMENT TOOL
- Publication number 20140269822
- Publication date Sep 18, 2014
- QUALITAU, INC.
- Edward McCloud
- G01 - MEASURING TESTING