David W. Murray

Person

Windsor, CA, US

People

Patents Applicationslast 30 patents

Information Patent Application
Method for normalized test line limits with measurement uncertainty
- Publication number 20080154530
- Publication date Jun 26, 2008
- David W. Murray
- G01 - MEASURING TESTING
Information Patent Application
Equipment testing system and method having scaleable test line limits
- Publication number 20080126001
- Publication date May 29, 2008
- David W. Murray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for storing embedded diagnostic test failure repo...
- Publication number 20080126868
- Publication date May 29, 2008
- David W. Murray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for performing embedded diagnostic application at...
- Publication number 20080088325
- Publication date Apr 17, 2008
- David W. Murray
- G01 - MEASURING TESTING
Information Patent Application
Development environment and basic tenets for enabling robust embedd...
- Publication number 20080079439
- Publication date Apr 3, 2008
- David W. Murray
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Measurement and calibration method for embedded diagnostic systems
- Publication number 20080082888
- Publication date Apr 3, 2008
- David W. Murray
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Performing Failure Diagnostic Testing of E...
- Publication number 20080059838
- Publication date Mar 6, 2008
- Phillipe A. Melman
- G01 - MEASURING TESTING

David W. Murray

Person

Patents Applicationslast 30 patents

Method for normalized test line limits with measurement uncertainty

Equipment testing system and method having scaleable test line limits

System and method for storing embedded diagnostic test failure repo...

Method and system for performing embedded diagnostic application at...

Development environment and basic tenets for enabling robust embedd...

Measurement and calibration method for embedded diagnostic systems

Apparatus And Method For Performing Failure Diagnostic Testing of E...