David William Sesko

Person

Woodinville, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Chromatic confocal range sensing system with enhanced spectrum ligh...
- Patent number 11,313,671
- Issue date Apr 26, 2022
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Optical configuration for measurement device using emitter material...
- Patent number 10,323,928
- Issue date Jun 18, 2019
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Linear displacement sensor using a position sensitive detector
- Patent number 10,101,181
- Issue date Oct 16, 2018
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Optical configuration for measurement device using emitter material...
- Patent number 10,006,757
- Issue date Jun 26, 2018
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic range sensor including dynamic intensity compensation fun...
- Patent number 9,958,266
- Issue date May 1, 2018
- Mitutoyo Corporation
- Andrew Michael Patzwald
- G02 - OPTICS
Information Patent Grant
Optical configuration for measurement device
- Patent number 9,803,972
- Issue date Oct 31, 2017
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device with multiplexed position signals
- Patent number 9,791,262
- Issue date Oct 17, 2017
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
- Patent number 9,115,982
- Issue date Aug 25, 2015
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic range sensor probe detachment sensor
- Patent number 9,068,822
- Issue date Jun 30, 2015
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable optics configuration for a chromatic range sensor o...
- Patent number 8,817,240
- Issue date Aug 26, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
- Patent number 8,736,817
- Issue date May 27, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic point sensor compensation including workpiece material ef...
- Patent number 8,587,789
- Issue date Nov 19, 2013
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic point sensor configuration including real time spectrum c...
- Patent number 8,587,772
- Issue date Nov 19, 2013
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Fixed wavelength absolute distance interferometer
- Patent number 8,179,534
- Issue date May 15, 2012
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic compensation of chromatic point sensor intensity profile da...
- Patent number 7,990,522
- Issue date Aug 2, 2011
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Intensity compensation for interchangeable chromatic point sensor c...
- Patent number 7,876,456
- Issue date Jan 25, 2011
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
On-site calibration method and object for chromatic point sensors
- Patent number 7,873,488
- Issue date Jan 18, 2011
- Mitutoyo Corporation
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal sensor fiber interface
- Patent number 7,791,712
- Issue date Sep 7, 2010
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
External cavity laser with flexure tuning element
- Patent number 7,653,094
- Issue date Jan 26, 2010
- Mitutoyo Corporation
- David W. Sesko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometer and method of calibrating the interferometer
- Patent number 7,511,827
- Issue date Mar 31, 2009
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for tilt and range measurement
- Patent number 7,433,052
- Issue date Oct 7, 2008
- Mitutoyo Corporation
- Joseph D Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and shape measuring method
- Patent number 7,397,570
- Issue date Jul 8, 2008
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Grant
Detector for interferometric distance measurement
- Patent number 7,333,214
- Issue date Feb 19, 2008
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Absolute distance measuring device
- Patent number 7,317,513
- Issue date Jan 8, 2008
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic quadrature detector
- Patent number 7,315,381
- Issue date Jan 1, 2008
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Grant
Dual laser high precision interferometer
- Patent number 7,292,347
- Issue date Nov 6, 2007
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Grant
External cavity laser with rotary tuning element
- Patent number 7,130,320
- Issue date Oct 31, 2006
- Mitutoyo Corporation
- Joseph D. Tobiason
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHROMATIC CONFOCAL RANGE SENSING SYSTEM WITH ENHANCED SPECTRUM LIGH...
- Publication number 20200378747
- Publication date Dec 3, 2020
- MITUTOYO CORPORATION
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CONFIGURATION FOR MEASUREMENT DEVICE USING EMITTER MATERIAL...
- Publication number 20180364026
- Publication date Dec 20, 2018
- MITUTOYO CORPORATION
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
LINEAR DISPLACEMENT SENSOR USING A POSITION SENSITIVE DETECTOR
- Publication number 20180283907
- Publication date Oct 4, 2018
- MITUTOYO CORPORATION
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CONFIGURATION FOR MEASUREMENT DEVICE
- Publication number 20170176170
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE WITH MULTIPLEXED POSITION SIGNALS
- Publication number 20170176171
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC RANGE SENSOR INCLUDING DYNAMIC INTENSITY COMPENSATION FUN...
- Publication number 20170010452
- Publication date Jan 12, 2017
- MITUTOYO CORPORATION
- Andrew Michael Patzwald
- G02 - OPTICS
Information Patent Application
Chromatic Range Sensor Probe Detachment Sensor
- Publication number 20150009484
- Publication date Jan 8, 2015
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
Interchangeable Chromatic Range Sensor Probe for a Coordinate Measu...
- Publication number 20140340679
- Publication date Nov 20, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
INTERCHANGEABLE CHROMATIC RANGE SENSOR PROBE FOR A COORDINATE MEASU...
- Publication number 20130314689
- Publication date Nov 28, 2013
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR O...
- Publication number 20130314690
- Publication date Nov 28, 2013
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC POINT SENSOR CONFIGURATION INCLUDING REAL TIME SPECTRUM C...
- Publication number 20130162972
- Publication date Jun 27, 2013
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC POINT SENSOR COMPENSATION INCLUDING WORKPIECE MATERIAL EF...
- Publication number 20130163006
- Publication date Jun 27, 2013
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
FIXED WAVELENGTH ABSOLUTE DISTANCE INTERFEROMETER
- Publication number 20120038930
- Publication date Feb 16, 2012
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC COMPENSATION OF CHROMATIC POINT SENSOR INTENSITY PROFILE DA...
- Publication number 20100283989
- Publication date Nov 11, 2010
- Mitutoyo Corporation
- David William Sesko
- G02 - OPTICS
Information Patent Application
INTENSITY COMPENSATION FOR INTERCHANGEABLE CHROMATIC POINT SENSOR C...
- Publication number 20100284025
- Publication date Nov 11, 2010
- MITUTOYO CORPORATION
- David William Sesko
- G02 - OPTICS
Information Patent Application
ON-SITE CALIBRATION METHOD AND OBJECT FOR CHROMATIC POINT SENSORS
- Publication number 20100145650
- Publication date Jun 10, 2010
- MITUTOYO CORPORATION
- Michael Nahum
- G01 - MEASURING TESTING
Information Patent Application
CHROMATIC CONFOCAL SENSOR FIBER INTERFACE
- Publication number 20080239323
- Publication date Oct 2, 2008
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
RANGE SENSOR USING STRUCTURED LIGHT INTENSITY
- Publication number 20080100820
- Publication date May 1, 2008
- Mitutoyo Corporation
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
Detector for interferometric distance measurement
- Publication number 20070229843
- Publication date Oct 4, 2007
- David William Sesko
- G01 - MEASURING TESTING
Information Patent Application
Dual laser high precision interferometer
- Publication number 20070024860
- Publication date Feb 1, 2007
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for tilt and range measurement
- Publication number 20070008550
- Publication date Jan 11, 2007
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and shape measuring method
- Publication number 20060262320
- Publication date Nov 23, 2006
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and method of calibrating the interferometer
- Publication number 20060250618
- Publication date Nov 9, 2006
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
External cavity laser with flexure tuning element
- Publication number 20060215724
- Publication date Sep 28, 2006
- Mitutoyo Corporation
- David W. Sesko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monolithic quadrature detector
- Publication number 20060087658
- Publication date Apr 27, 2006
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Application
Absolute distance measuring device
- Publication number 20060012772
- Publication date Jan 19, 2006
- Mitutoyo Corporation
- David W. Sesko
- G01 - MEASURING TESTING
Information Patent Application
External cavity laser with rotary tuning element
- Publication number 20050105565
- Publication date May 19, 2005
- Mitutoyo Corporation
- Joseph D. Tobiason
- H01 - BASIC ELECTRIC ELEMENTS

David William Sesko

Person

Patents Grantslast 30 patents

Chromatic confocal range sensing system with enhanced spectrum ligh...

Optical configuration for measurement device using emitter material...

Linear displacement sensor using a position sensitive detector

Optical configuration for measurement device using emitter material...

Chromatic range sensor including dynamic intensity compensation fun...

Optical configuration for measurement device

Measurement device with multiplexed position signals

Interchangeable chromatic range sensor probe for a coordinate measu...

Chromatic range sensor probe detachment sensor

Interchangeable optics configuration for a chromatic range sensor o...

Interchangeable chromatic range sensor probe for a coordinate measu...

Chromatic point sensor compensation including workpiece material ef...

Chromatic point sensor configuration including real time spectrum c...

Fixed wavelength absolute distance interferometer

Dynamic compensation of chromatic point sensor intensity profile da...

Intensity compensation for interchangeable chromatic point sensor c...

On-site calibration method and object for chromatic point sensors

Chromatic confocal sensor fiber interface

External cavity laser with flexure tuning element

Interferometer and method of calibrating the interferometer

Systems and methods for tilt and range measurement

Interferometer and shape measuring method

Detector for interferometric distance measurement

Absolute distance measuring device

Monolithic quadrature detector

Dual laser high precision interferometer

External cavity laser with rotary tuning element

Patents Applicationslast 30 patents

CHROMATIC CONFOCAL RANGE SENSING SYSTEM WITH ENHANCED SPECTRUM LIGH...

OPTICAL CONFIGURATION FOR MEASUREMENT DEVICE USING EMITTER MATERIAL...

LINEAR DISPLACEMENT SENSOR USING A POSITION SENSITIVE DETECTOR

OPTICAL CONFIGURATION FOR MEASUREMENT DEVICE

MEASUREMENT DEVICE WITH MULTIPLEXED POSITION SIGNALS

CHROMATIC RANGE SENSOR INCLUDING DYNAMIC INTENSITY COMPENSATION FUN...

Chromatic Range Sensor Probe Detachment Sensor

Interchangeable Chromatic Range Sensor Probe for a Coordinate Measu...

INTERCHANGEABLE CHROMATIC RANGE SENSOR PROBE FOR A COORDINATE MEASU...

INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR O...

CHROMATIC POINT SENSOR CONFIGURATION INCLUDING REAL TIME SPECTRUM C...

CHROMATIC POINT SENSOR COMPENSATION INCLUDING WORKPIECE MATERIAL EF...

FIXED WAVELENGTH ABSOLUTE DISTANCE INTERFEROMETER

DYNAMIC COMPENSATION OF CHROMATIC POINT SENSOR INTENSITY PROFILE DA...

INTENSITY COMPENSATION FOR INTERCHANGEABLE CHROMATIC POINT SENSOR C...

ON-SITE CALIBRATION METHOD AND OBJECT FOR CHROMATIC POINT SENSORS

CHROMATIC CONFOCAL SENSOR FIBER INTERFACE

RANGE SENSOR USING STRUCTURED LIGHT INTENSITY

Detector for interferometric distance measurement

Dual laser high precision interferometer

Systems and methods for tilt and range measurement

Interferometer and shape measuring method

Interferometer and method of calibrating the interferometer

External cavity laser with flexure tuning element

Monolithic quadrature detector

Absolute distance measuring device

External cavity laser with rotary tuning element