David Willis

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Murray, UT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method to control amplitude and phase of a signal
- Patent number 11,569,817
- Issue date Jan 31, 2023
- Alps Alpine Co., Ltd.
- David Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods to create offset signal using sinewave generato...
- Patent number 11,048,361
- Issue date Jun 29, 2021
- Alps Alpine Co., Ltd.
- David Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Providing nonlinear temperature compensation for sensing means by u...
- Patent number 7,991,571
- Issue date Aug 2, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Initial decision-point circuit operation mode
- Patent number 7,526,693
- Issue date Apr 28, 2009
- Semiconductor Components Industries, LLC
- David J. Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Providing nonlinear temperature compensation for sensing means by u...
- Patent number 7,398,173
- Issue date Jul 8, 2008
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method To Control Amplitude And Phase Of A Signal
- Publication number 20220123748
- Publication date Apr 21, 2022
- Alps Alpine Co., Ltd.
- David WILLIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SERIES OFFSET CAPACITOR FOR INTERNAL REFERENCE BASED CAPACITIVE SAM...
- Publication number 20170123486
- Publication date May 4, 2017
- Cirque Corporation
- David Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Providing Nonlinear Temperature Compensation for Sensing Means by U...
- Publication number 20080270062
- Publication date Oct 30, 2008
- Jose Marcos LARAIA
- G01 - MEASURING TESTING
Information Patent Application
Providing nonlinear temperature compensation for sensing means by u...
- Publication number 20060265167
- Publication date Nov 23, 2006
- Jose Marcos Laraia
- G01 - MEASURING TESTING