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David Y. Lewis
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Jerusalem, IL
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last 30 patents
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Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
Publication number
20250123320
Publication date
Apr 17, 2025
InZiv Ltd.
David Judah Lewis
G01 - MEASURING TESTING
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Patent Application
SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAI...
Publication number
20120137395
Publication date
May 31, 2012
NANONICS IMAGING LTD.
Aaron Lewis
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor nanocrystal-based optical devices and method of prepa...
Publication number
20070178615
Publication date
Aug 2, 2007
YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM
Uri Banin
C30 - CRYSTAL GROWTH