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David Yap Chua
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Carver, MN, US
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last 30 patents
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Patent Grant
Extensometer structure
Patent number
10,852,118
Issue date
Dec 1, 2020
MTS Systems Corporation
Richard A. Meyer
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ALIGNMENT APPARATUS AND METHODS FOR TESTING SYSTEM
Publication number
20250164364
Publication date
May 22, 2025
Illinois Tool Works Inc.
Richard A. Meyer
G01 - MEASURING TESTING
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Patent Application
EXTENSOMETER STRUCTURE
Publication number
20190178619
Publication date
Jun 13, 2019
MTS Systems Corporation
Richard A. Meyer
G01 - MEASURING TESTING