David Zimdars

Person

Ann Arbor, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for determining at least one property of a sheet dielectric...
- Patent number 10,215,696
- Issue date Feb 26, 2019
- Picometrix, LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Grant
System and method to detect anomalies
- Patent number 10,024,963
- Issue date Jul 17, 2018
- PICOMETRIX LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detection and measurement of interfacial prop...
- Patent number 9,588,041
- Issue date Mar 7, 2017
- Picometrix, LLC
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Grant
System for calculation of material properties using reflection tera...
- Patent number 9,360,296
- Issue date Jun 7, 2016
- Picometrix, LLC
- Jeffrey S. White
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method to measure the transit time position(s) of pulses...
- Patent number 8,457,915
- Issue date Jun 4, 2013
- Picometrix, LLC
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Grant
System and method reducing fiber stretch induced timing errors in f...
- Patent number 8,436,310
- Issue date May 7, 2013
- Picometrix, LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Grant
Optical delay
- Patent number 8,390,910
- Issue date Mar 5, 2013
- Picometrix, LLC
- David A. Zimdars
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz imaging system for examining articles
- Patent number 7,449,695
- Issue date Nov 11, 2008
- Picometrix
- David A. Zimdars
- G01 - MEASURING TESTING
Information Patent Grant
Amplified photoconductive gate
- Patent number 6,936,821
- Issue date Aug 30, 2005
- Picometrix, Inc.
- Steven L. Williamson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact fiber pigtailed terahertz modules
- Patent number 6,816,647
- Issue date Nov 9, 2004
- Picometrix, Inc.
- James V. Rudd
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL ANGULAR METROLOGY
- Publication number 20250076208
- Publication date Mar 6, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER
- Publication number 20250052666
- Publication date Feb 13, 2025
- KLA Corporation
- Chao Chang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC...
- Publication number 20170023469
- Publication date Jan 26, 2017
- PICOMETRIX, LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERA...
- Publication number 20150268030
- Publication date Sep 24, 2015
- PICOMETRIX, LLC
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO DETECT ANOMALIES
- Publication number 20150060673
- Publication date Mar 5, 2015
- Picometrix LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROP...
- Publication number 20120304756
- Publication date Dec 6, 2012
- PICOMETRIX, LLC
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD REDUCING FIBER STRETCH INDUCED TIMING ERRORS IN F...
- Publication number 20120175520
- Publication date Jul 12, 2012
- PICOMETRIX, LLC
- David Zimdars
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO MEASURE THE TRANSIT TIME POSITION(S) OF PULSES...
- Publication number 20100280779
- Publication date Nov 4, 2010
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION AND NONLINEAR COMPENSATOR FOR OPTICAL DELIVERY FIBER
- Publication number 20090190933
- Publication date Jul 30, 2009
- Greg Fichter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Optical Delay
- Publication number 20080259428
- Publication date Oct 23, 2008
- David A. Zimdars
- G02 - OPTICS
Information Patent Application
Terahertz imaging system for examining articles
- Publication number 20070235658
- Publication date Oct 11, 2007
- David A. Zimdars
- G01 - MEASURING TESTING
Information Patent Application
Amplified photoconductive gate
- Publication number 20030127673
- Publication date Jul 10, 2003
- Picometrix, Inc.
- Steven L. Williamson
- H03 - BASIC ELECTRONIC CIRCUITRY

David Zimdars

Person

Patents Grantslast 30 patents

System for determining at least one property of a sheet dielectric...

System and method to detect anomalies

System and method for detection and measurement of interfacial prop...

System for calculation of material properties using reflection tera...

System and method to measure the transit time position(s) of pulses...

System and method reducing fiber stretch induced timing errors in f...

Optical delay

Terahertz imaging system for examining articles

Amplified photoconductive gate

Compact fiber pigtailed terahertz modules

Patents Applicationslast 30 patents

SPECTRAL ANGULAR METROLOGY

DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER

SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC...

SYSTEM FOR CALCULATION OF MATERIAL PROPERTIES USING REFLECTION TERA...

SYSTEM AND METHOD TO DETECT ANOMALIES

SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROP...

SYSTEM AND METHOD REDUCING FIBER STRETCH INDUCED TIMING ERRORS IN F...

SYSTEM AND METHOD TO MEASURE THE TRANSIT TIME POSITION(S) OF PULSES...

DISPERSION AND NONLINEAR COMPENSATOR FOR OPTICAL DELIVERY FIBER

Optical Delay

Terahertz imaging system for examining articles

Amplified photoconductive gate