Dawei Hu

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Scatterometry based methods and systems for measurement of strain i...
- Patent number 11,573,077
- Issue date Feb 7, 2023
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-environment polarized infrared reflectometer for semiconducto...
- Patent number 11,231,362
- Issue date Jan 25, 2022
- KLA Corporation
- Guorong V. Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Measurement methodology of advanced nanostructures
- Patent number 11,156,548
- Issue date Oct 26, 2021
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Scatterometry based methods and systems for measurement of strain i...
- Patent number 11,060,846
- Issue date Jul 13, 2021
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,770,362
- Issue date Sep 8, 2020
- KLA Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 10,410,935
- Issue date Sep 10, 2019
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispersion model for band gap tracking
- Patent number 9,595,481
- Issue date Mar 14, 2017
- KLA-Tencor Corporation
- Natalia Malkova
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Measurements Of Semiconductor Structures Based On Spectral Differen...
- Publication number 20240186191
- Publication date Jun 6, 2024
- KLA Corporation
- Ming Di
- G01 - MEASURING TESTING
Information Patent Application
Scatterometry Based Methods And Systems For Measurement Of Strain I...
- Publication number 20210293532
- Publication date Sep 23, 2021
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
Scatterometry Based Methods And Systems For Measurement Of Strain I...
- Publication number 20200200525
- Publication date Jun 25, 2020
- KLA Corporation
- Houssam Chouaib
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measurement Methodology of Advanced Nanostructures
- Publication number 20190178788
- Publication date Jun 13, 2019
- KLA-Tencor Corporation
- Manh Nguyen
- G05 - CONTROLLING REGULATING