De-Jian LIU

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Jhubei City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Devices for high-density probing techniques and method of implement...
- Patent number 11,249,112
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Devices for high-density probing techniques and method of implement...
- Patent number 10,718,790
- Issue date Jul 21, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Devices for high-density probing techniques and method of implement...
- Patent number 10,274,518
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Test-yield improvement devices for high-density probing techniques...
- Patent number 9,354,254
- Issue date May 31, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mill-Jer Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES AND METHOD OF IMPLEMENT...
- Publication number 20200348341
- Publication date Nov 5, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES AND METHOD OF IMPLEMENT...
- Publication number 20190302146
- Publication date Oct 3, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES AND METHOD OF IMPLEMENT...
- Publication number 20160313372
- Publication date Oct 27, 2016
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING
Information Patent Application
TEST-YIELD IMPROVEMENT DEVICES FOR HIGH-DENSITY PROBING TECHNIQUES...
- Publication number 20140266273
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Mill-Jer WANG
- G01 - MEASURING TESTING