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Dean A. Stocker
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Fitchburg, WI, US
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Patents Grants
last 30 patents
Information
Patent Grant
Processing of spectrometer pile-up events
Patent number
8,027,811
Issue date
Sep 27, 2011
Thermo Electron Scientific Instruments LLC
Patrick Paul Camus
G01 - MEASURING TESTING
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Patent Grant
Feedback circuit for output control in a semiconductor X-ray detector
Patent number
7,554,091
Issue date
Jun 30, 2009
Thermo Electron Scientific Instruments LLC
William E. Drummond
G01 - MEASURING TESTING
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Patent Grant
Feedback circuit for output control in a semiconductor X-ray detector
Patent number
7,339,175
Issue date
Mar 4, 2008
Thermo Electron Scientific Instruments LLC
William E. Drummond
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROCESSING OF SPECTROMETER PILE-UP EVENTS
Publication number
20080319714
Publication date
Dec 25, 2008
Patrick Paul Camus
G01 - MEASURING TESTING
Information
Patent Application
Feedback Circuit for Output Control in a Semiconductor X-Ray Detector
Publication number
20080116384
Publication date
May 22, 2008
William E. Drummond
G01 - MEASURING TESTING