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Dean Corley
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Tempe, AZ, US
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last 30 patents
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Patent Grant
Integral semiconductor wafer map recording
Patent number
5,256,578
Issue date
Oct 26, 1993
Motorola, Inc.
Dean Corley
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method of recording test results of die on a wafer
Patent number
4,928,002
Issue date
May 22, 1990
Motorola Inc.
Dean Corley
G01 - MEASURING TESTING