Dean G. Percy

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Stowe, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit test optimization using adaptive test pattern sa...
- Patent number 8,689,066
- Issue date Apr 1, 2014
- International Business Machines Corporation
- Matthew S. Grady
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensation in maximum frequency measurement and speed...
- Patent number 7,058,531
- Issue date Jun 6, 2006
- International Business Machines Corporation
- Jennifer E. Appleyard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SA...
- Publication number 20130007546
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Matthew S. Grady
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING A MULTI-PROCESSOR UNIT MICROPROCESSOR
- Publication number 20070162446
- Publication date Jul 12, 2007
- David Peter Appenzeller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE COMPENSATION IN MAXIMUM FREQUENCY MEASUREMENT AND SPEED...
- Publication number 20050222792
- Publication date Oct 6, 2005
- International Business Machines Corporation
- Jennifer E. Appleyard
- G01 - MEASURING TESTING