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Dean J. Grannes
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Fremont, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Circuit for sensing on-die temperature at multiple locations
Patent number
7,018,095
Issue date
Mar 28, 2006
Intel Corporation
Dean J. Grannes
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to measure statistical variation of electrical...
Patent number
6,596,980
Issue date
Jul 22, 2003
Intel Corporation
Stefan Rusu
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor die manufacture method to limit a voltage drop on a p...
Patent number
6,519,744
Issue date
Feb 11, 2003
Intel Corporation
Steven G. Seidel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Circuit for sensing on-die temperature at multiple locations
Publication number
20040001527
Publication date
Jan 1, 2004
Dean J. Grannes
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus to measure statistical variation of electrical...
Publication number
20030042439
Publication date
Mar 6, 2003
Stefan Rusu
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor die manufacture method to limit a voltage drop on a p...
Publication number
20020073386
Publication date
Jun 13, 2002
Steven G. Seidel
G01 - MEASURING TESTING