Dean M. Hunt

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Danville, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatuses for and methods of monitoring optical radiation paramet...
- Patent number 7,482,576
- Issue date Jan 27, 2009
- KLA-Tencor Corporation
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for low distortion parameter measurements
- Patent number 7,299,148
- Issue date Nov 20, 2007
- OnWafer Technologies, Inc.
- Dean Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Optical testing of integrated circuits with temperature control
- Patent number 7,064,568
- Issue date Jun 20, 2006
- Credence Systems Corporation
- Dean M. Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Optical testing of integrated circuits with temperature control
- Patent number 6,836,014
- Issue date Dec 28, 2004
- Credence Systems Corporation
- Dean M. Hunt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatuses for and methods of monitoring optical radiation paramet...
- Publication number 20060289763
- Publication date Dec 28, 2006
- Randall S. Mundt
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for low distortion parameter measurements
- Publication number 20060052969
- Publication date Mar 9, 2006
- Dean Hunt
- G01 - MEASURING TESTING
Information Patent Application
Optical testing of integrated circuits with temperature control
- Publication number 20050168212
- Publication date Aug 4, 2005
- Credence Systems Corporation
- Dean M. Hunt
- G01 - MEASURING TESTING
Information Patent Application
Optical testing of integrated circuits with temperature control
- Publication number 20040065880
- Publication date Apr 8, 2004
- Schlumberger Technologies, Inc.
- Dean M. Hunt
- G01 - MEASURING TESTING