Deana R. Delp

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for data analysis
- Patent number 11,853,899
- Issue date Dec 26, 2023
- In-Depth Test LLC
- Deana Delp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Man-machine interface for monitoring and controlling a process
- Patent number 7,158,845
- Issue date Jan 2, 2007
- Tokyo Electron Limited
- Richard Parsons
- G05 - CONTROLLING REGULATING
Information Patent Grant
Integrated VI probe
- Patent number 7,154,256
- Issue date Dec 26, 2006
- Tokyo Electron Limited
- Richard Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Endpoint detection using laser interferometry
- Patent number 7,115,211
- Issue date Oct 3, 2006
- Tokyo Electron Limited
- Deana R. Delp
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
- Publication number 20180293500
- Publication date Oct 11, 2018
- In-Depth Test LLC
- Deana Delp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Apparatus for Data Analysis
- Publication number 20160026915
- Publication date Jan 28, 2016
- In-Depth Test LLC
- Deana Delp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR DATA ANALYSIS
- Publication number 20110178967
- Publication date Jul 21, 2011
- Test Advantage, Inc.
- Deana Delp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Intelligent system for detection of process status, process fault a...
- Publication number 20060259198
- Publication date Nov 16, 2006
- TOKYO ELECTRON LIMITED
- Jozef Brcka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and system for analyzing data from a plasma process
- Publication number 20050199341
- Publication date Sep 15, 2005
- TOKYO ELECTRON LIMITED
- Deana Delp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated vi probe
- Publication number 20050184668
- Publication date Aug 25, 2005
- TOKYO ELECTRON LIMITED
- Rick Parsons
- G01 - MEASURING TESTING
Information Patent Application
Endpoint detection using laser interferometry
- Publication number 20050087515
- Publication date Apr 28, 2005
- TOKYO ELECTRON LIMITED
- Deana R. Delp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Facility monitor
- Publication number 20040250108
- Publication date Dec 9, 2004
- Richard Parsons
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Man-machine interface for monitoring and controlling a process
- Publication number 20040236451
- Publication date Nov 25, 2004
- Richard Parsons
- G05 - CONTROLLING REGULATING

Deana R. Delp

Person

Patents Grantslast 30 patents

Methods and apparatus for data analysis

Man-machine interface for monitoring and controlling a process

Integrated VI probe

Endpoint detection using laser interferometry

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR DATA ANALYSIS

Methods and Apparatus for Data Analysis

METHODS AND APPARATUS FOR DATA ANALYSIS

Intelligent system for detection of process status, process fault a...

Method and system for analyzing data from a plasma process

Integrated vi probe

Endpoint detection using laser interferometry

Facility monitor

Man-machine interface for monitoring and controlling a process