Deborah M. Massey

Person

Jericho, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 11,054,459
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,996,259
- Issue date May 4, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,989,754
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,564,214
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electromigration testing of interconnect analogues having bottom-co...
- Patent number 9,851,397
- Issue date Dec 26, 2017
- GLOBALFOUNDRIES Inc.
- Fen Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,739,824
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,395,403
- Issue date Jul 19, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating thermally controlled refractory metal resistor
- Patent number 8,765,568
- Issue date Jul 1, 2014
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally controlled refractory metal resistor
- Patent number 8,592,947
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel array architecture for constant current electro-migration...
- Patent number 8,217,671
- Issue date Jul 10, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
IC chip stress testing
- Patent number 7,512,506
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Oliver Aubel
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,511,378
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhancement of performance of a conductive wire in a multilayered s...
- Patent number 7,096,450
- Issue date Aug 22, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200141996
- Publication date May 7, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200072897
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20180074114
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20170285094
- Publication date Oct 5, 2017
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20160258994
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...
- Publication number 20160258998
- Publication date Sep 8, 2016
- GLOBALFOUNDRIES INC.
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20150115994
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY CONTROLLED REFRACTORY METAL RESISTOR
- Publication number 20140038381
- Publication date Feb 6, 2014
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...
- Publication number 20120259575
- Publication date Oct 11, 2012
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY CONTROLLED REFRACTORY METAL RESISTOR
- Publication number 20120146186
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Joseph M. Lukaitis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel Array Architecture for Constant Current Electro-Migration...
- Publication number 20100327892
- Publication date Dec 30, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
IC CHIP STRESS TESTING
- Publication number 20080297188
- Publication date Dec 4, 2008
- International Business Machines Corporation
- Oliver Aubel
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of performance of a conductive wire in a multilayered s...
- Publication number 20060226142
- Publication date Oct 12, 2006
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...
- Publication number 20040262031
- Publication date Dec 30, 2004
- International Business Machines Corporation
- Jason P. Gill
- G06 - COMPUTING CALCULATING COUNTING

Deborah M. Massey

Person

Patents Grantslast 30 patents

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Electromigration testing of interconnect analogues having bottom-co...

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Method of fabricating thermally controlled refractory metal resistor

Thermally controlled refractory metal resistor

Parallel array architecture for constant current electro-migration...

IC chip stress testing

Enhancement of performance of a conductive wire in a multilayered s...

Enhancement of performance of a conductive wire in a multilayered s...

Patents Applicationslast 30 patents

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

ELECTROMIGRATION TESTING OF INTERCONNECT ANALOGUES HAVING BOTTOM-CO...

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

THERMALLY CONTROLLED REFRACTORY METAL RESISTOR

INTEGRATED CIRCUIT CHIP INCORPORATING A TEST CIRCUIT THAT ALLOWS FO...

THERMALLY CONTROLLED REFRACTORY METAL RESISTOR

Parallel Array Architecture for Constant Current Electro-Migration...

IC CHIP STRESS TESTING

Enhancement of performance of a conductive wire in a multilayered s...

ENHANCEMENT OF PERFORMANCE OF A CONDUCTIVE WIRE IN A MULTILAYERED S...