Deepak A. Ramappa

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Orlando, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Copper silicide passivation for improved reliability
- Patent number 6,869,873
- Issue date Mar 22, 2005
- Agere Systems Inc.
- Robert Wayne Bradshaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring in-line copper contamination
- Patent number 6,607,927
- Issue date Aug 19, 2003
- Agere Systems, INC
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling contamination during the elect...
- Patent number 6,573,183
- Issue date Jun 3, 2003
- Agere Systems Inc.
- Sailesh Mansinh Merchant
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Copper silicide passivation for improved reliability
- Publication number 20040097075
- Publication date May 20, 2004
- Robert Wayne Bradshaw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for monitoring in-line copper contamination
- Publication number 20030064533
- Publication date Apr 3, 2003
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING CONTAMINATION DURING THE ELECT...
- Publication number 20030064586
- Publication date Apr 3, 2003
- Sailesh Mansinh Merchant
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR