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Deepak JINDAL
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Noida, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for measuring signal skew of asynchronous flash memory co...
Patent number
9,324,455
Issue date
Apr 26, 2016
FREESCALE SEMICONDUCTOR, INC.
Vishal Vadhavania
G11 - INFORMATION STORAGE
Information
Patent Grant
System for testing electronic circuits
Patent number
8,855,962
Issue date
Oct 7, 2014
FREESCALE SEMICONDUCTOR, INC.
Deepak Jindal
G05 - CONTROLLING REGULATING
Information
Patent Grant
System for performing electrical characterization of asynchronous i...
Patent number
8,521,463
Issue date
Aug 27, 2013
FREESCALE SEMICONDUCTOR, INC.
Deepak Jindal
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing asynchronous modules in semiconductor device
Patent number
8,522,089
Issue date
Aug 27, 2013
FREESCALE SEMICONDUCTOR, INC.
Deepak Jindal
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for setting counter threshold value
Patent number
8,175,213
Issue date
May 8, 2012
FREESCALE SEMICONDUCTOR, INC.
Deepak Jindal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR MEASURING SIGNAL SKEW OF ASYNCHRONOUS FLASH MEMORY CO...
Publication number
20150348648
Publication date
Dec 3, 2015
FREESCALE SEMICONDUCTOR, INC.
Vishal Vadhavania
G11 - INFORMATION STORAGE
Information
Patent Application
SYSTEM FOR TESTING ELECTRONIC CIRCUITS
Publication number
20130218508
Publication date
Aug 22, 2013
FREESCALE SEMICONDUCTOR, INC.
Deepak JINDAL
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR PERFORMING ELECTRICAL CHARACTERIZATION OF ASYNCHRONOUS I...
Publication number
20120278027
Publication date
Nov 1, 2012
FREESCALE SEMICONDUCTOR, INC.
Deepak JINDAL
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF TESTING ASYNCHRONOUS MODULES IN SEMICONDUCTOR DEVICE
Publication number
20120192021
Publication date
Jul 26, 2012
FREESCALE SEMICONDUCTOR, INC.
Deepak JINDAL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR SETTING COUNTER THRESHOLD VALUE
Publication number
20120027159
Publication date
Feb 2, 2012
FREESCALE SEMICONDUCTOR, INC.
Deepak JINDAL
G01 - MEASURING TESTING