Deepkishore Mukhopadhyay

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Chicago, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Metrology probe with built-in angle and method of fabrication thereof
- Patent number 11,719,719
- Issue date Aug 8, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Thermally stable, drift resistant probe for a scanning probe micros...
- Patent number 11,644,480
- Issue date May 9, 2023
- Bruker Nano, Inc.
- Jeffrey K. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction leveraged modulation of X-ray pulses using MEMS-based X...
- Patent number 9,412,480
- Issue date Aug 9, 2016
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for spatially modulating X-ray pulses using MEMS-based X-ray...
- Patent number 8,976,933
- Issue date Mar 10, 2015
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Metrology Probe with Built-In Angle and Method of Fabrication Thereof
- Publication number 20220404392
- Publication date Dec 22, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
Thermally Stable, Drift Resistant Probe for a Scanning Probe Micros...
- Publication number 20200241038
- Publication date Jul 30, 2020
- Bruker Nano, Inc.
- Jeffrey K. Wong
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION LEVERAGED MODULATION OF X-RAY PULSES USING MEMS-BASED X...
- Publication number 20140334607
- Publication date Nov 13, 2014
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD FOR SPATIALLY MODULATING X-RAY PULSES USING MEMS-BASED X-RAY...
- Publication number 20130077759
- Publication date Mar 28, 2013
- UChicago Argonne, LLC
- Daniel Lopez
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING