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Degang Chen
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Ames, IA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Voltage reference generator with linear and non-linear temperature...
Patent number
10,359,801
Issue date
Jul 23, 2019
Iowa State University Research Foundation, Inc.
Degang James Chen
G05 - CONTROLLING REGULATING
Information
Patent Grant
Cost effective DAC linearization system
Patent number
10,218,371
Issue date
Feb 26, 2019
Iowa State University Research Foundation, Inc.
Yuming Zhuang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Signal generator with self-calibration
Patent number
10,116,317
Issue date
Oct 30, 2018
Iowa State University Research Foundation, Inc.
Yuming Zhuang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and methodology for analog-to-digital converter linearity te...
Patent number
9,184,759
Issue date
Nov 10, 2015
Zhongjun Yu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and methodology for analog-to-digital converter linearity te...
Patent number
8,947,276
Issue date
Feb 3, 2015
Zhongjun Yu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for testing analog and mixed-signal circuits using dynamic e...
Patent number
7,587,647
Issue date
Sep 8, 2009
Iowa State University Research Foundation, Inc.
Beatriz Olleta
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing analog and mixed-signal circuits using functiona...
Patent number
7,129,734
Issue date
Oct 31, 2006
Iowa State University Research Foundation, Inc.
Randall Geiger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WIDE RANGE TEMPERATURE-TO-DIGITAL CONVERTER WITHOUT EXPLICIT DATA C...
Publication number
20240011845
Publication date
Jan 11, 2024
Iowa State University Research Foundation, Inc.
Mona Ganji
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE SENSOR ARRAY AND MICRO-HEATER THERMAL CALIBRATION
Publication number
20230417607
Publication date
Dec 28, 2023
Iowa State University Research Foundation, Inc.
Randall Geiger
G01 - MEASURING TESTING
Information
Patent Application
Method for testing analog and mixed-signal circuits using functiona...
Publication number
20050088164
Publication date
Apr 28, 2005
Iowa State University Research Foundation, Inc.
Randall Geiger
G01 - MEASURING TESTING
Information
Patent Application
Method for testing analog and mixed-signal circuits using dynamic e...
Publication number
20050057271
Publication date
Mar 17, 2005
Beatriz Olleta
G01 - MEASURING TESTING