Dejan Jovanovic

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring and modeling spaces using markerless augmented...
- Patent number 11,682,177
- Issue date Jun 20, 2023
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for measuring and modeling spaces using markerl...
- Patent number 11,527,009
- Issue date Dec 13, 2022
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring and modeling spaces using markerless augmented...
- Patent number 11,164,387
- Issue date Nov 2, 2021
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for measuring and modeling spaces using markerl...
- Patent number 11,138,757
- Issue date Oct 5, 2021
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring and modeling spaces using markerless augmented...
- Patent number 10,679,424
- Issue date Jun 9, 2020
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring and modeling spaces using markerless augmented...
- Patent number 10,304,254
- Issue date May 28, 2019
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image based measurement system
- Patent number 10,083,522
- Issue date Sep 25, 2018
- SMART PICTURE TECHNOLOGIES, INC.
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of making a dual strained channel semiconductor device
- Patent number 7,282,402
- Issue date Oct 16, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Mariam G. Sadaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure having strained semiconductor and method th...
- Patent number 7,205,210
- Issue date Apr 17, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Alexander L. Barr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Channel orientation to enhance transistor performance
- Patent number 7,160,769
- Issue date Jan 9, 2007
- FREESCALE SEMICONDUCTOR, INC.
- Ted R. White
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...
- Publication number 20230110919
- Publication date Apr 13, 2023
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...
- Publication number 20220254110
- Publication date Aug 11, 2022
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...
- Publication number 20220172391
- Publication date Jun 2, 2022
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...
- Publication number 20210082189
- Publication date Mar 18, 2021
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...
- Publication number 20200357132
- Publication date Nov 12, 2020
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...
- Publication number 20190347859
- Publication date Nov 14, 2019
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...
- Publication number 20190051054
- Publication date Feb 14, 2019
- Smart Picture Technologies, Inc.
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE BASED MEASUREMENT SYSTEM
- Publication number 20160371855
- Publication date Dec 22, 2016
- Dejan Jovanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR 3D CAPTURE BASED ON STRUCTURE FROM MOTION WIT...
- Publication number 20160260250
- Publication date Sep 8, 2016
- Dejan JOVANOVIC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE TEMPLATE IMPROVED 3D MODELING OF IMAGED OBJECTS USING CAME...
- Publication number 20160134860
- Publication date May 12, 2016
- Dejan Jovanovic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ORTHOGRAPHIC IMAGE CAPTURE SYSTEM
- Publication number 20140307100
- Publication date Oct 16, 2014
- Kari MYLLYKOSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Channel orientation to enhance transistor performance
- Publication number 20060084207
- Publication date Apr 20, 2006
- Ted R. White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor structure having strained semiconductor and method th...
- Publication number 20050181549
- Publication date Aug 18, 2005
- Alexander L. Barr
- H01 - BASIC ELECTRIC ELEMENTS

Dejan Jovanovic

Person

Patents Grantslast 30 patents

Method for measuring and modeling spaces using markerless augmented...

Methods and systems for measuring and modeling spaces using markerl...

Method for measuring and modeling spaces using markerless augmented...

Methods and systems for measuring and modeling spaces using markerl...

Method for measuring and modeling spaces using markerless augmented...

Method for measuring and modeling spaces using markerless augmented...

Image based measurement system

Method of making a dual strained channel semiconductor device

Semiconductor structure having strained semiconductor and method th...

Channel orientation to enhance transistor performance

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...

METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...

METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...

METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...

METHODS AND SYSTEMS FOR MEASURING AND MODELING SPACES USING MARKERL...

METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...

METHOD FOR MEASURING AND MODELING SPACES USING MARKERLESS AUGMENTED...

IMAGE BASED MEASUREMENT SYSTEM

METHOD AND SYSTEM FOR 3D CAPTURE BASED ON STRUCTURE FROM MOTION WIT...

MULTIPLE TEMPLATE IMPROVED 3D MODELING OF IMAGED OBJECTS USING CAME...

ORTHOGRAPHIC IMAGE CAPTURE SYSTEM

Channel orientation to enhance transistor performance

Semiconductor structure having strained semiconductor and method th...