Delmas R. Buckley, JR.

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Livermore, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods for generating test patterns for sequential circuits
- Patent number 8,156,395
- Issue date Apr 10, 2012
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Single-pass, concurrent-validation methods for generating test patt...
- Patent number 7,958,421
- Issue date Jun 7, 2011
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Single-pass methods for generating test patterns for sequential cir...
- Patent number 7,231,571
- Issue date Jun 12, 2007
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for incremental behavioral validation of digital...
- Patent number 7,165,231
- Issue date Jan 16, 2007
- Yardstick Research, L.L.C.
- Delmas R. Buckley, Jr.
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR GENERATING TEST PATTERNS FOR SEQUENTIAL CIRCUITS
- Publication number 20100023824
- Publication date Jan 28, 2010
- Delmas R. Buckley, JR.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Single-pass, concurrent-validation methods for generating test patt...
- Publication number 20090049354
- Publication date Feb 19, 2009
- Yardstick Research, LLC
- Delmas R. Buckley, JR.
- G01 - MEASURING TESTING